Title: |
Multi-Modal Scanning X-Ray Microscopy |
Presentation Start/End Time: |
Thursday, Oct 15, 2009, 4:00 PM - 4:30 PM |
Author Block: |
Andreas Menzel1, Pierre Thibault1, Martin Dierolf2, Cameron M. Kewish1, Franz Pfeiffer2, Oliver Bunk1; 1Paul Scherrer Inst., Switzerland, 2Technische Univ. München, Germany. |
Presentation Number: |
FThT1 |
Category: |
Symposium: Optics for Imaging at the Nanoscale and Beyond |
Scanning X-ray microscopy offers a wide variety of contrast modes. The combination with coherent diffractive imaging allows image resolution to be increased beyond the size of the X-ray probe. |
|